Electron microscope with low accelerating voltage
It is a small, versatile electron microscope with an accelerating voltage of 5 kV and a resolution of a few nanometres. Its great advantage is the ability to view samples in multiple modes : TEM, STEM and SEM BSE.
In Transmission Electron Microscopy (TEM) mode, the sample can be viewed at magnifications up to 700,000x. Standard electron microscopy grids with a diameter of 3mm are used for viewing.
In Scanning Transmission Electron Microscopy (STEM) mode, a maximum magnification of 250,000x can be achieved.
When the microscope is switched to the scanning electron microscope (SEM) mode, the backscattered electron detector (SEM-BSE) is used to produce a stereoscopic image of the sample. The observed object is placed on a special support whose size corresponds to the TEM grid – 3mm.
